EMAG 2009
8–11 Sep 2009
Sheffield, United Kingdom
8–11 Sep 2009
Sheffield, United Kingdom
Description
Electron microscopy is currently in a period of rapid technological development, with advances such as aberration correctors, monochromators, developments in focused ion-beam instruments, and new detector technologies opening many new research avenues. Alongside these come developments in existing techniques and the invention of new techniques. All these advances are broadening the range of electron microscope application at a time when the ever shrinking dimensions of new technologies require it.
Electron microscopy is currently in a period of rapid technological development, with advances such as aberration correctors, monochromators, developments in focused ion-beam instruments, and new detector technologies opening many new research avenues. Alongside these come developments in existing techniques and the invention of new techniques. All these advances are broadening the range of electron microscope application at a time when the ever shrinking dimensions of new technologies require it.